Sök i kursutbudet

Använda sökfunktionen för att hitta i Chalmers utbildningsutbud, både vad gäller kurser och program. När det finns en kurshemsida visas en hus-symbol som leder till denna sida. Tänk på att välja det läsår du vill se information om.
Sök program och utbildningsplaner


Institutionernas kurser för doktorander

​​​​​​​​​​​​​​​​​​​​

Kursplan för

Läsår
TIF110 - Advanced analysis methods
 
Kursplanen fastställd 2012-02-22 av programansvarig (eller motsvarande)
Ägare: MPAPP
7,5 Poäng
Betygskala: TH - Fem, Fyra, Tre, Underkänt
Utbildningsnivå: Avancerad nivå
Huvudområde: Teknisk fysik
Institution: 16 - FYSIK


Undervisningsspråk: Engelska
Sökbar för utbytesstudenter
Blockschema: D

Modul   Poängfördelning   Tentamensdatum
Lp1 Lp2 Lp3 Lp4 Sommarkurs Ej Lp
0107 Tentamen 7,5 hp Betygskala: TH   7,5 hp    

I program

MPAEM MATERIALS ENGINEERING, MSC PROGR, Årskurs 1 (valbar)
MPAPP APPLIED PHYSICS, MSC PROGR, Årskurs 1 (valbar)
MPMCN MATERIALS CHEMISTRY AND NANOTECHNOLOGY, MSC PROGR, Årskurs 2 (valbar)
MPMCN MATERIALS CHEMISTRY AND NANOTECHNOLOGY, MSC PROGR, Årskurs 1 (valbar)

Examinator:

Bitr professor  Janusz Kanski
Bitr professor  Lena Falk


Kursutvärdering:

http://document.chalmers.se/doc/6e6a4ac9-fd75-493c-80db-cc63a792481c


Behörighet:

För kurser inom Chalmers utbildningsprogram gäller samma behörighetskrav som till de(t) program kursen ingår i.

Kursspecifika förkunskaper

Basic courses in physics and/or condensed materials are recommended.

Syfte

The purpose of this course is to develop a knowledge of important analytical
methods that are used in research and development. The techniques are based
on spectroscopic and imaging principles, probing electronic and structural
properties of solid materials such as high performance metals, alloys and
ceramics, biomaterials and nanostructures.
The students obtain training in selecting techniques appropriate for
specific analytical problems, and apply them in hands-on laboratory
projects.

Lärandemål (efter fullgjord kurs ska studenten kunna)

After the course the student should be able to:
Select appropriate analysis methods for a specific task
Apply imaging and spectroscopic tools
Evaluate results from imaging and spectroscopic experiments
Critically evaluate the limitations of imaging and spectroscopic experiments

Innehåll

The course covers different imaging, spectroscopy and diffraction techniques. The main topics of the course are:
X-ray diffraction
Electron diffraction
Neutron diffraction and neutron sources
IR vibrational spectroscopy
Raman spectroscopy
X-ray photoelectron spectroscopy
Auger electron spectroscopy
Secondary ion mass spectroscopy
Nuclear magnetic resonance: imaging and spectroscopy
Transmission and scanning transmission electron microscopy
Electron energy loss spectroscopy
Scanning electron microscopy
X-ray energy dispersive spectrometry
Focussed ion beam microscopy and manipulation
Atom probe tomography
Scanning probe microscopy
Large scale facilities
Probes for biological systems

Organisation

The course consists of lectures, lab visits and a short project. Attendance at a minimum of 80 % of the lectures is required. Two of the techniques discussed in the lectures are used in a short project on the investigation of a selected material or a component. Obtained results are presented in a written report and orally in a seminar at the end of the course.

Litteratur

Material in the form of lecture notes and ppt-presentations will be available on the web site of the course.

Examination

The short project is compulsory. The student has to deliver a written project report and give an oral presentation of the project.


Sidansvarig Publicerad: må 13 jul 2020.