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Syllabus for

Academic year
FFY431 - Electron microscopy and microanalysis
 
Owner: MAMAS
5,0 Credits (ECTS 7,5)
Grading: TH - Five, Four, Three, Not passed
Level: A
Department: 16 - PHYSICS


Teaching language: English

Course module   Credit distribution   Examination dates
Sp1 Sp2 Sp3 Sp4 No Sp
0198 Examination 5,0 c Grading: TH   5,0 c   Contact examiner,  Contact examiner,  Contact examiner

In programs

MAMAS MSc PROGR IN ADVANCED MATERIALS, Year 1 (compulsory)
TTFYA ENGINEERING PHYSICS, Year 4 (elective)

Examiner:

Professor  Mats Halvarsson



Eligibility:

For single subject courses within Chalmers programmes the same eligibility requirements apply, as to the programme(s) that the course is part of.

Aim

To give the practical and theoretical knowledge needed to perform qualified electron microscopic investigations of the microstructure and composition of materials.

Content

The course starts with a treatment of the principles of electron optics and the design of important com-ponents of electron optical instruments. This is followed by a discussion of the interaction between high energy electrons and matter. This forms the basis for a treatment of the image forming modes of the scanning electron microscope (SEM) and different analytical methods such as X-ray micro-analysis (EDX and WDX) and electron energy loss spectroscopy (EELS). The major part of the course deals with transmission electron microscopy (TEM) of crystalline materials. The image formation will be described in two steps: first based on geometrical considerations and then using a wave-optical approach. Finally other forms of electron optical instruments for microscpoy and micro-analysis will be described.

Literature

Electron Microscopy and Microanalysis, Lecture notes, CTH 1997.
Handouts for the laboratory lessons.

Examination

A written examination will be given at the end of the course during the 4th quarter.



Page manager Published: Mon 28 Nov 2016.