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Syllabus for

Academic year
TIF340 - Advanced materials imaging and microanalysis  
Avancerad avbildning och mikroanalys
Syllabus adopted 2020-02-11 by Head of Programme (or corresponding)
Owner: MPPHS
7,5 Credits
Grading: TH - Pass with distinction (5), Pass with credit (4), Pass (3), Fail
Education cycle: Second-cycle
Major subject: Engineering Physics
Department: 16 - PHYSICS

Teaching language: English
Application code: 85137
Open for exchange students: Yes
Block schedule: D+

Module   Credit distribution   Examination dates
Sp1 Sp2 Sp3 Sp4 Summer course No Sp
0120 Examination 7,5 c Grading: TH   7,5 c   28 Oct 2020 am J   05 Jan 2021 am J,  16 Aug 2021 am J

In programs

MPPHS PHYSICS, MSC PROGR, Year 2 (elective)
MPPHS PHYSICS, MSC PROGR, Year 1 (compulsory elective)


Lena Falk

  Go to Course Homepage


General entry requirements for Master's level (second cycle)
Applicants enrolled in a programme at Chalmers where the course is included in the study programme are exempted from fulfilling the requirements above.

Specific entry requirements

English 6 (or by other approved means with the equivalent proficiency level)
Applicants enrolled in a programme at Chalmers where the course is included in the study programme are exempted from fulfilling the requirements above.

Course specific prerequisites

Fundamentals of solid state physics


The purpose of this course is to provide a basic knowledge of the physics behind modern imaging and microanalytical techniques based on the interaction of a probe of energetic electrons or ions with matter, and to develop an understanding of how different signals generated in these processes may be interpreted in terms of a material’s structure at the atomic, nano and micro scales. The course will also give some practical experience of up-to-date instrumentation utilizing the techniques in imaging and microanalysis that are discussed. The techniques discussed in the course are powerful tools that are widely used in materials research and development in both industry and academia. The course provides a basis for specialised courses in, for example, experimental physics, materials physics and nanoscience.

Learning outcomes (after completion of the course the student should be able to)

After completion of this course the student should be able to discuss the physics behind image formation, diffraction and microanalysis based on electron interaction with mattter.  The student should also be able to discuss critical aspects of modern electron and ion imaging and microanalytical techniques in terms of obtained information, resolution, accuracy and sensitivity.  The student will get both theoretical and practical experience of the scanning and transmission electron microscopes (SEM, TEM), focused ion beam instruments (FIB) and microanalytical techniques such as X-ray energy dispersive spectrometry (XEDS) and electron energy loss spectroscopy (EELS).


•  Electron interaction with matter.
•  Ion interaction with matter.
•  Image formation using lenses.
•  Electron diffraction.
•  X-ray energy dispersive spectrometry (XEDS)
•  Electron energy loss spectroscopy (EELS).
•  Resolution.
•  Scanning electron microscopy (SEM).
•  Transmission electron microscopy (TEM).
•  Focused ion beam (FIB) instruments.


The course comprises lectures, tutorials and compulsory laboratory sessions.


Selected chapters in the following two ebooks:

1.  Transmission Electron Microscopy [electronic resource] : A Textbook for Materials Science

by David B. Williams, C. Barry Carter.  Springer eBooksNew York, NY : Springer US : Imprint: Springer, 20092nd ed. 2009.

2.  Scanning Electron Microscopy and X-Ray Microanalysis [electronic resource]

by Joseph I. Goldstein, Dale E. Newbury, Joseph R. Michael, Nicholas W.M. Ritchie, John Henry J. Scott, David C. Joy. Springer eBooksNew York, NY : Springer New York : Imprint: Springer, 20184th ed. 2018.

Examination including compulsory elements

Written examination.  Compulsory laboratory sessions.

Page manager Published: Mon 28 Nov 2016.