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Graduate courses

Departments' graduate courses for PhD-students.

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Syllabus for

Academic year
TIF030 - Modern imaging, spectroscopy and diffraction techniques
 
Syllabus adopted 2012-02-22 by Head of Programme (or corresponding)
Owner: MPAPP
7,5 Credits
Grading: TH - Five, Four, Three, Not passed
Education cycle: Second-cycle
Major subject: Engineering Physics
Department: 16 - PHYSICS


Teaching language: English
Open for exchange students
Block schedule: C

Course module   Credit distribution   Examination dates
Sp1 Sp2 Sp3 Sp4 Summer course No Sp
0105 Examination 7,5c Grading: TH   7,5c   23 Oct 2012 pm H,  15 Jan 2013 pm M,  30 Aug 2013 am M

In programs

MPAEM MATERIALS ENGINEERING, MSC PROGR, Year 2 (elective)
MPAPP APPLIED PHYSICS, MSC PROGR, Year 1 (compulsory elective)
MPBME BIOMEDICAL ENGINEERING, MSC PROGR, Year 2 (elective)
MPNAT NANOTECHNOLOGY, MSC PROGR, Year 2 (elective)
MPPAS PHYSICS AND ASTRONOMY, MSC PROGR, Year 2 (elective)
MPWPS WIRELESS, PHOTONICS AND SPACE ENGINEERING, MSC PROGR, Year 2 (elective)

Examiner:

Professor  Eva Olsson
Professor  Mikael Käll


Course evaluation:

http://document.chalmers.se/doc/6823ad94-7e77-4a61-a599-2ca19d8ef84c


Eligibility:

For single subject courses within Chalmers programmes the same eligibility requirements apply, as to the programme(s) that the course is part of.

Course specific prerequisites

Basic courses in physics and/or condensed materials are recommended.

Aim

Advanced imaging, spectroscopy and diffraction techniques are used in industry as well as academia. Many methods are based on radiation (for example, radio waves, light, X-rays and electrons) while others are based on other effects e.g. electric fields or atomic forces. They provide crucial information about the correlation between structure and properties that enables basic understanding of condensed matter and also the tailoring of materials and devices in all areas ranging from high performance steels, biomaterials, electronics and nanostructures.

The aim of this course is to provide basic understanding and practical experience from using some of the most important modern imaging, spectroscopy and diffraction techniques. It includes both practical exercises and basic theory for optical, electron and scanning probe microscopies. The course provides an insight into these methods that is essential for careers in both science and R&D-industry. It is a base for more advanced and specialised courses in material analysis techniques.

Learning outcomes (after completion of the course the student should be able to)

After the course the student should be able to:
Define and discuss the basic concepts of imaging using lens image formation
Define and discuss the basic concepts of scanning probe microscopies
Define and discuss the basic concepts of diffraction
Define and discuss the basic concepts of spectroscopy
Explain the concept of spatial resolution
Understand critical aspects of specimen preparation prior to analysis
To read and understand advanced literature on imaging, spectroscopy and diffraction
Identify critical aspects of an analysis technique in terms of information that can be obtained, resolution, precision and sensitivity
Derive the optimal analysis technique or combination of techniques for a particular material issue

Content

The course covers the working principles and capacities of modern imaging, spectroscopy and diffraction techniques. The main topics of the course are:
Introduction, history and overview
Image formation using lenses
Image formation using scanning probe techniques
Diffraction
Spectroscopy
Resolution
Sensitivity
Precision
Hands-on-laboratory sessions

Organisation

The course consists of lectures and practical laboratory sessions on microscopes. The practical sessions are compulsory. Each lecture is combined with a home assignment. Correct solutions that are submitted not later than the deadline give bonus points on the written examination.

Literature

Joseph I. Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy, A. D. Romig Jr., Charles E. Lyman, Charles Fiori and Eric Lifshin, Scanning Electron Microscopy and X-Ray Microanalysis , 1992, Plenum Press, ISBN 0-306-44175-6.

David. B. Williams and C. Barry Carter, Transmission Electron Microscopy , 1996 Plenum Press, New York, ISBN 0-306-45324.

Extra material in the form of scientific articles, ppt-presentations will be available on the web site of the course.

Examination

The lab sessions are compulsory. A list of questions needs to be answered prior to each lab session. There is a written exam at the end of the course.


Page manager Published: Thu 04 Feb 2021.